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Volume 27 Issue 4
Aug.  2021
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Article Contents
ZHANG Hui, TENG Jiao, MA Jidong, YU Guanghua, HU Qiang. Effects of the thickness and deposition rate of Ta seed layer on the anisotropic mag-netoresistance and coercivity of Ta/Ni65Co35 bilayers[J]. Chinese Journal of Engineering, 2005, 27(4): 458-461. doi: 10.13374/j.issn1001-053x.2005.04.017
Citation: ZHANG Hui, TENG Jiao, MA Jidong, YU Guanghua, HU Qiang. Effects of the thickness and deposition rate of Ta seed layer on the anisotropic mag-netoresistance and coercivity of Ta/Ni65Co35 bilayers[J]. Chinese Journal of Engineering, 2005, 27(4): 458-461. doi: 10.13374/j.issn1001-053x.2005.04.017

Effects of the thickness and deposition rate of Ta seed layer on the anisotropic mag-netoresistance and coercivity of Ta/Ni65Co35 bilayers

doi: 10.13374/j.issn1001-053x.2005.04.017
  • Received Date: 2004-05-10
  • Rev Recd Date: 2005-09-10
  • Available Online: 2021-08-17
  • The effects of the thickness and deposition rate of Ta seed layer on the anisotropic magnetoresistance (AMP.) and coercivity ofTa/Ni65Co35 bilayers were investigated. The results showed that △ρ/ρ of Ta/Ni65Co35 bilayers could be improved at a certain thickness or higher deposition rate. The coercivity of Ta/Ni65Co35 films increased with the use of Ta seed layer. But the effect of the deposition rate on the coercivity of Ta/Ni65Co35 films was not significant.

     

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