Analysis of Atomic Force Microscope Images of Adsorbed Film on Material Surface Formed by the Compound Artificial Synovia

YU Luqing; LU Yiqiang; LI Jiuqing; GAO Jin

doi:10.13374/j.issn1001-053x.2002.01.038

Volume 24 Issue 1

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YU Luqing, LU Yiqiang, LI Jiuqing, GAO Jin. Analysis of Atomic Force Microscope Images of Adsorbed Film on Material Surface Formed by the Compound Artificial Synovia[J]. Chinese Journal of Engineering, 2002, 24(1): 34-37. doi: 10.13374/j.issn1001-053x.2002.01.038

Citation:

YU Luqing, LU Yiqiang, LI Jiuqing, GAO Jin. Analysis of Atomic Force Microscope Images of Adsorbed Film on Material Surface Formed by the Compound Artificial Synovia[J]. Chinese Journal of Engineering, 2002, 24(1): 34-37. doi: 10.13374/j.issn1001-053x.2002.01.038

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Analysis of Atomic Force Microscope Images of Adsorbed Film on Material Surface Formed by the Compound Artificial Synovia

doi: 10.13374/j.issn1001-053x.2002.01.038

1. Applied Science School, UST Beijing, Beijing 100083;
2. Material Science and Engineering School, UST Beijing. Beijing 100083, China

Received Date: 2000-11-29
Available Online: 2021-08-21

Abstract

Abstract

In order to find the potential factors resulting in significant improvements in the lubricating behavior of a compound artificial synovia, which was prepared by ourselves with hyaluronic acid mainly and some proteins and phospholipids, the technology of Atomic Force Microscope (AFM) was used to observe the appearance of adsorbed film on material surface formed by the compound artificial synovia. The results show that adsorbed film exhibits lots of clear elliptical molecules only with the coexistence of y-globulin, Lα-DPPC and Hyaluronic Acid(HA), which means this kind of artificial synovia has a high resistance to shearing action and a significant improvement in boundary lubrication.
- artificial synovia,
- adsorbed film,
- AFM