脈沖激光亦或電子束輻照對SUS316L奧氏體不銹鋼中空位擴散的影響

楊蘇冰; 楊占兵; 王會

doi:10.13374/j.issn2095-9389.2017.06.013

脈沖激光亦或電子束輻照對SUS316L奧氏體不銹鋼中空位擴散的影響

doi: 10.13374/j.issn2095-9389.2017.06.013

楊蘇冰^1,2,
楊占兵^1,2, ,,
王會^1,2

1) 北京科技大學冶金與生態工程學院, 北京 100083
2) 北京科技大學鋼鐵冶金新技術國家重點實驗室, 北京 100083

基金項目:

國家自然科學基金資助項目(51471027)

2014年鋼鐵冶金新技術國家重點實驗室開放基金資助項目(KF14-03)

中央高校基本科研業務費

詳細信息

中圖分類號: TL341
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出版歷程
- 收稿日期: 2016-09-23

Effect of pulsed-laser and/or electron irradiation on vacancy diffusion in SUS316L austenitic stainless steel

YANG Su-bing^1,2,
YANG Zhan-bing^{1,2
, ,},
WANG Hui^1,2

1) School of Metallurgical and Ecological Engineering, University of Science and Technology Beijing, Beijing 100083, China
2) State Key Laboratory of Advanced Metallurgy, University of Science and Technology Beijing, Beijing 100083, China

摘要

摘要: 利用激光-超高壓電子顯微鏡系統在500℃對SUS316L奧氏體不銹鋼進行了電子束輻照和脈沖激光-電子束雙束同時輻照(以下簡稱:同時輻照),通過觀察和分析輻照后自由晶界處無空洞區域以及元素偏析,以電子束輻照結果為標準,對比研究了同時輻照對空位擴散的影響.結果表明:同時輻照后的無空洞區域寬度為48 ±16 nm,小于電子輻照的71 ±27 nm;不論在偏析程度還是偏析寬度上,同時輻照條件下Cr和Ni的偏析都小于對應的電子束輻照;同時輻照下空位的擴散通量僅為電子束輻照的45.7%.通過分析得出,和電子輻照相比,同時輻照促進了空位與間隙原子的再結合,限制空位向尾閭擴散,進而造成流入尾閭的空位數量減少,極大地抑制了輻照偏析與腫脹.脈沖激光-電子束雙束同時輻照可以為探索抑制腫脹方法提供新的思路.
- 奧氏體不銹鋼 /
- 脈沖激光-電子束雙束同時輻照 /
- 過飽和空位 /
- 無空洞區域 /
- 輻照偏析 /
- 輻照腫脹
Abstract: Electron irradiation and simultaneous pulsed-laser and electron dual-beam irradiation were performed using laser high voltage electronic microscopy (HVEM) at 500℃, and the void-denuded zone (VDZ) and radiation-induced segregation (RIS) near the random grain boundary were observed and analyzed after irradiation. Compared to electron irradiation, the effect of simultaneous pulsed-laser and electron dual-beam irradiation on vacancy diffusion was investigated. The results show that the width of VDZ after simultaneous pulsed-laser and electron dual-beam irradiation is 48 ±16 nm which is smaller than the VDZ width of 71 ±27 nm after electron irradiation. Both the magnitude and width of Cr and Ni segregation under simultaneous pulsed-laser and electron dual-beam irradiation are lower than those under electron irradiation. The ratio of vacancy flux of simultaneous pulsed-laser and electron dual-beam irradiation to that of electron irradiation is 45.7%. Compared to electron irradiation, the vacancy flux flowing into point defect sinks is lower owing to enhanced recombination between vacancies and interstitial spaces under simultaneous pulsed-laser and electron dualbeam irradiation. This has the effect of suppressing RIS and void swelling. Therefore, simultaneous pulsed-laser and electron dualbeam irradiation is expected to provide new insights into the suppression of void swelling.
- austenitic stainless steel /
- simultaneous pulsed-laser and electron dual-beam irradiation /
- excess vacancies /
- void denuded zone /
- radiation-induced segregation /
- void swelling

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