Stability analysis of a planar liquid/solid interface of directional solidification in pure melt under perturbation of a far-field flow
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摘要: 利用漸近分析方法研究在小的遠場來流擾動作用下純熔體內具有液固平直界面的凝固過程的穩定性,導出了液固界面的擾動振幅變化率與波數的色散關系,以此為基礎給出了具有液固平直界面的凝固過程的穩定性判據,揭示了金屬凝固過程中液固平直界面轉變為胞晶界面的內在機理.Abstract: The stability of a planar liquid/solid interface of solidification in pure melt under perturbation of a small far-field flow was studied by using asymptotic analysis. A dispersion relation between the wave number and perturbation amplification rate was derived, and the morphological stability of planar liquid-solid interface of solidification was determined. The results reveal the mechanism of the transition from planar interface to cellular interface in directional solidification.
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Key words:
- melt /
- crystal growth /
- liquid/solid interface /
- planar interface /
- asymptotic analysis
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